Nanostructured CeO2 thin films : A SAXS study of the interface between grains and pores

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Bibliographic Details
Published in:Thin solid films 2007-05, Vol.515 (14), p.5624-5626
Main Authors: LUCIC LAVCEVIB, M, TURKOVIC, A, DUBCEK, P, BERNSTORFF, S
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Nanoscale materials and structures: fabrication and characterization
Other topics in nanoscale materials and structures
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2006.12.014