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Thermal annealing effect on structural and electrical properties of chemical bath-deposited CdS films
X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and electrical investigations of CdCl 2–thiourea–ammonia bath-deposited (CBD) CdS films on glass before and after post-deposition annealing have been carried out. The thio...
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Published in: | Thin solid films 2008-08, Vol.516 (20), p.7008-7012 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS) and electrical investigations of CdCl
2–thiourea–ammonia bath-deposited (CBD) CdS films on glass before and after post-deposition annealing have been carried out. The thiourea (TU) concentration, temperature and H
2, vacuum and isothermal ambient have been varied at low concentration of cadmium 1 mM. Coverage on glass, resistivity of CdS and mobility of charge carriers could be controlled by temperature, time and ambient of heat-treatment, and by thiourea concentration in bath. It is concluded that sintering of CdS, slow diffusion, incorporation in lattice and vaporization of cadmium chloride are the main factors of the heat-treatment process, responsible for changes in resistivity of CBD CdS. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2007.12.008 |