Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

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Bibliographic Details
Published in:Thin solid films 2010-01, Vol.518 (7), p.1830-1834
Main Authors: SAENGER, M. F, SUN, J, SCHÄDEL, M, HILFIKER, J, SCHUBERT, M, WOOLLAM, J. A
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Energy
Exact sciences and technology
Natural energy
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Optical properties of specific thin films
Photovoltaic conversion
Physics
Solar cells. Photoelectrochemical cells
Solar energy
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ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2009.09.042