Synthesis and electrical characterization of low-temperature thermal-cured epoxy resin/functionalized silica hybrid-thin films for application as gate dielectrics

• Published in: Thin solid films 2013-07, Vol.539, p.274-277
• Main Authors: Na, Moonkyong, Kang, Young Taec, Kim, Sang Cheol, Kim, Eun Dong
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport phenomena in thin films and low-dimensional structures; Epoxy resin; Exact sciences and technology; Gate dielectrics; Hybrid; Physics; Silica; Surface and interface electron states; Thin film
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2013.05.005

Thermal-cured hybrid materials were synthesized from homogenous hybrid sols of epoxy resins and organoalkoxysilane-functionalized silica. The chemical structures of raw materials and obtained hybrid materials were characterized using Fourier transform infrared spectroscopy. The thermal resistance of the hybrids was enhanced by hybridization. The interaction between epoxy matrix and the silica particles, which caused hydrogen bonding and van der Waals force was strengthened by organoalkoxysilane. The degradation temperature of the hybrids was improved by approximately 30°C over that of the parent epoxy material. The hybrid materials were formed into uniformly coated thin films of about 50nm-thick using a spin coater. An optimum mixing ratio was used to form smooth-surfaced hybrid films. The electrical property of the hybrid film was characterized, and the leakage current was found to be well below 10−6 A cm−2. •Preparation of thermal-curable hybrid materials using epoxy resin and silica.•The thermal stability was enhanced through hybridization.•The insulation property of hybrid film was investigated as gate dielectrics.