Observation of feature ripening inversion effect at the percolation threshold for the growth of thin silver films

• Published in: Thin solid films 2014-04, Vol.556, p.381-384
• Main Authors: Nehm, Frederik, Schubert, Sylvio, Müller-Meskamp, Lars, Leo, Karl
• Format: Article
• Language: English
• Subjects: Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Growth behavior; In-situ; Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Percolation; Physics; Silver; Theory and models of film growth; Thin metal films
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2014.01.067

The growth behavior of thin silver films on organic layers is investigated during deposition by means of simultaneous in-situ monitoring of sheet resistance and transmittance. Thermally evaporated films up to 11nm show a distinct percolation behavior with strong resistance drop at the percolation thickness. Additionally, evaporations are divided into a sequence of one nanometer steps. In the deposition breaks, the films exhibit a ripening effect with an inversion at the percolation thickness, by changing from an increasing to decreasing sheet resistance over time. Scanning electron micrographs suggest same ripening mechanisms for islands below the percolation thickness as for holes above. •Fundamental understanding of metal thin film growth is presented.•Optical and electrical in-situ measurements used for optimizing transparent electrodes•Stepwise Ag deposition reveals extraordinary ripening effects.•Feature ripening inversion is discovered at the percolation threshold.