Manganite based memristors: Influence of the electroforming polarity on the electrical behavior and radiation hardness

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Bibliographic Details
Published in:Thin solid films 2015-05, Vol.583, p.76-80
Main Authors: Rubi, D., Kalstein, A., Román, W.S., Ghenzi, N., Quinteros, C., Mangano, E., Granell, P., Golmar, F., Marlasca, F.G., Suarez, S., Bernardi, G., Albornoz, C., Leyva, A.G., Levy, P.
Format: Article
Language:English
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ISSN:0040-6090
DOI:10.1016/j.tsf.2015.03.048