Loading…

Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure

•CdO/MoS2 heterostructure has a type-II band structure and a large built-in electric field pointing to CdO.•CdO/MoS2 heterostructure has suitable band gap and band edge position for photocatalytic water splitting.•CdO/MoS2 heterostructure with large carrier mobility can withstand large biaxial strai...

Full description

Saved in:
Bibliographic Details
Published in:Thin solid films 2023-01, Vol.764, p.139626, Article 139626
Main Authors: Yan, Zheng-Hua, Zhang, Yan, Qiao, Hui, Duan, Li, Ni, Lei
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3
cites cdi_FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3
container_end_page
container_issue
container_start_page 139626
container_title Thin solid films
container_volume 764
creator Yan, Zheng-Hua
Zhang, Yan
Qiao, Hui
Duan, Li
Ni, Lei
description •CdO/MoS2 heterostructure has a type-II band structure and a large built-in electric field pointing to CdO.•CdO/MoS2 heterostructure has suitable band gap and band edge position for photocatalytic water splitting.•CdO/MoS2 heterostructure with large carrier mobility can withstand large biaxial strains.•More electrons can participate in the water splitting reaction under tensile strain. The structural stability, electronic properties, band edge alignment and photocatalytic water splitting characteristics of the CdO/MoS2 heterostructure have been systematically investigated by first-principles calculations. The results show that the CdO/MoS2 heterostructure is a stable indirect bandgap (1.35 eV) semiconductor with a type-II band alignment and a large built-in electric field pointing from MoS2 to CdO, which greatly hinders the recombination of photogenerated carriers. Meanwhile, the CdO/MoS2 heterostructure with large carrier mobility can withstand the large biaxial strains. The band edge positions of the CdO/MoS2 heterostructure can be modulated by biaxial strain engineering. These results provide a theoretical basis for the application of the CdO/MoS2 heterostructure in photovoltaic and other electronic devices.
doi_str_mv 10.1016/j.tsf.2022.139626
format article
fullrecord <record><control><sourceid>elsevier_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1016_j_tsf_2022_139626</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0040609022005284</els_id><sourcerecordid>S0040609022005284</sourcerecordid><originalsourceid>FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3</originalsourceid><addsrcrecordid>eNp9kMtKAzEUhoMoWKsP4C4vMGMubTLBlRQvhUoXVVyGTHLSptSZIUkLfXtT69rVgXP4_vPzIXRPSU0JFQ_bOidfM8JYTbkSTFygEW2kqpjk9BKNCJmQShBFrtFNSltCCGWMj1C7ytGEDkO3Dh1ADN0a5w1g2IHNse-CxUPsB4g5QMK9_z3m4wDVfI5nbvnw3q8YPpgOO4j4y5hdwhvIEPuU497mfYRbdOXLGu7-5hh9vjx_zN6qxfJ1PntaVJYpmSvhubKqoXzKZKsUNdKW_qadKiDOE8G4a10rmW-4bZqJNVMQTCpGuRXWtYaPET3n2vI8RfB6iOHbxKOmRJ8k6a0ukvRJkj5LKszjmYFS7BAg6mQDdBZciEWAdn34h_4BLUtwYw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure</title><source>Elsevier</source><creator>Yan, Zheng-Hua ; Zhang, Yan ; Qiao, Hui ; Duan, Li ; Ni, Lei</creator><creatorcontrib>Yan, Zheng-Hua ; Zhang, Yan ; Qiao, Hui ; Duan, Li ; Ni, Lei</creatorcontrib><description>•CdO/MoS2 heterostructure has a type-II band structure and a large built-in electric field pointing to CdO.•CdO/MoS2 heterostructure has suitable band gap and band edge position for photocatalytic water splitting.•CdO/MoS2 heterostructure with large carrier mobility can withstand large biaxial strains.•More electrons can participate in the water splitting reaction under tensile strain. The structural stability, electronic properties, band edge alignment and photocatalytic water splitting characteristics of the CdO/MoS2 heterostructure have been systematically investigated by first-principles calculations. The results show that the CdO/MoS2 heterostructure is a stable indirect bandgap (1.35 eV) semiconductor with a type-II band alignment and a large built-in electric field pointing from MoS2 to CdO, which greatly hinders the recombination of photogenerated carriers. Meanwhile, the CdO/MoS2 heterostructure with large carrier mobility can withstand the large biaxial strains. The band edge positions of the CdO/MoS2 heterostructure can be modulated by biaxial strain engineering. These results provide a theoretical basis for the application of the CdO/MoS2 heterostructure in photovoltaic and other electronic devices.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2022.139626</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Band edge alignment ; Electronic property ; First-principles calculation ; Strain engineering ; Structural stability ; Van der Waals heterostructure</subject><ispartof>Thin solid films, 2023-01, Vol.764, p.139626, Article 139626</ispartof><rights>2022 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3</citedby><cites>FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Yan, Zheng-Hua</creatorcontrib><creatorcontrib>Zhang, Yan</creatorcontrib><creatorcontrib>Qiao, Hui</creatorcontrib><creatorcontrib>Duan, Li</creatorcontrib><creatorcontrib>Ni, Lei</creatorcontrib><title>Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure</title><title>Thin solid films</title><description>•CdO/MoS2 heterostructure has a type-II band structure and a large built-in electric field pointing to CdO.•CdO/MoS2 heterostructure has suitable band gap and band edge position for photocatalytic water splitting.•CdO/MoS2 heterostructure with large carrier mobility can withstand large biaxial strains.•More electrons can participate in the water splitting reaction under tensile strain. The structural stability, electronic properties, band edge alignment and photocatalytic water splitting characteristics of the CdO/MoS2 heterostructure have been systematically investigated by first-principles calculations. The results show that the CdO/MoS2 heterostructure is a stable indirect bandgap (1.35 eV) semiconductor with a type-II band alignment and a large built-in electric field pointing from MoS2 to CdO, which greatly hinders the recombination of photogenerated carriers. Meanwhile, the CdO/MoS2 heterostructure with large carrier mobility can withstand the large biaxial strains. The band edge positions of the CdO/MoS2 heterostructure can be modulated by biaxial strain engineering. These results provide a theoretical basis for the application of the CdO/MoS2 heterostructure in photovoltaic and other electronic devices.</description><subject>Band edge alignment</subject><subject>Electronic property</subject><subject>First-principles calculation</subject><subject>Strain engineering</subject><subject>Structural stability</subject><subject>Van der Waals heterostructure</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKAzEUhoMoWKsP4C4vMGMubTLBlRQvhUoXVVyGTHLSptSZIUkLfXtT69rVgXP4_vPzIXRPSU0JFQ_bOidfM8JYTbkSTFygEW2kqpjk9BKNCJmQShBFrtFNSltCCGWMj1C7ytGEDkO3Dh1ADN0a5w1g2IHNse-CxUPsB4g5QMK9_z3m4wDVfI5nbvnw3q8YPpgOO4j4y5hdwhvIEPuU497mfYRbdOXLGu7-5hh9vjx_zN6qxfJ1PntaVJYpmSvhubKqoXzKZKsUNdKW_qadKiDOE8G4a10rmW-4bZqJNVMQTCpGuRXWtYaPET3n2vI8RfB6iOHbxKOmRJ8k6a0ukvRJkj5LKszjmYFS7BAg6mQDdBZciEWAdn34h_4BLUtwYw</recordid><startdate>20230101</startdate><enddate>20230101</enddate><creator>Yan, Zheng-Hua</creator><creator>Zhang, Yan</creator><creator>Qiao, Hui</creator><creator>Duan, Li</creator><creator>Ni, Lei</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20230101</creationdate><title>Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure</title><author>Yan, Zheng-Hua ; Zhang, Yan ; Qiao, Hui ; Duan, Li ; Ni, Lei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Band edge alignment</topic><topic>Electronic property</topic><topic>First-principles calculation</topic><topic>Strain engineering</topic><topic>Structural stability</topic><topic>Van der Waals heterostructure</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yan, Zheng-Hua</creatorcontrib><creatorcontrib>Zhang, Yan</creatorcontrib><creatorcontrib>Qiao, Hui</creatorcontrib><creatorcontrib>Duan, Li</creatorcontrib><creatorcontrib>Ni, Lei</creatorcontrib><collection>CrossRef</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yan, Zheng-Hua</au><au>Zhang, Yan</au><au>Qiao, Hui</au><au>Duan, Li</au><au>Ni, Lei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure</atitle><jtitle>Thin solid films</jtitle><date>2023-01-01</date><risdate>2023</risdate><volume>764</volume><spage>139626</spage><pages>139626-</pages><artnum>139626</artnum><issn>0040-6090</issn><eissn>1879-2731</eissn><abstract>•CdO/MoS2 heterostructure has a type-II band structure and a large built-in electric field pointing to CdO.•CdO/MoS2 heterostructure has suitable band gap and band edge position for photocatalytic water splitting.•CdO/MoS2 heterostructure with large carrier mobility can withstand large biaxial strains.•More electrons can participate in the water splitting reaction under tensile strain. The structural stability, electronic properties, band edge alignment and photocatalytic water splitting characteristics of the CdO/MoS2 heterostructure have been systematically investigated by first-principles calculations. The results show that the CdO/MoS2 heterostructure is a stable indirect bandgap (1.35 eV) semiconductor with a type-II band alignment and a large built-in electric field pointing from MoS2 to CdO, which greatly hinders the recombination of photogenerated carriers. Meanwhile, the CdO/MoS2 heterostructure with large carrier mobility can withstand the large biaxial strains. The band edge positions of the CdO/MoS2 heterostructure can be modulated by biaxial strain engineering. These results provide a theoretical basis for the application of the CdO/MoS2 heterostructure in photovoltaic and other electronic devices.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2022.139626</doi></addata></record>
fulltext fulltext
identifier ISSN: 0040-6090
ispartof Thin solid films, 2023-01, Vol.764, p.139626, Article 139626
issn 0040-6090
1879-2731
language eng
recordid cdi_crossref_primary_10_1016_j_tsf_2022_139626
source Elsevier
subjects Band edge alignment
Electronic property
First-principles calculation
Strain engineering
Structural stability
Van der Waals heterostructure
title Strain engineering the electronic properties of the type-II CdO/MoS2 van der Waals heterostructure
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T20%3A19%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-elsevier_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Strain%20engineering%20the%20electronic%20properties%20of%20the%20type-II%20CdO/MoS2%20van%20der%20Waals%20heterostructure&rft.jtitle=Thin%20solid%20films&rft.au=Yan,%20Zheng-Hua&rft.date=2023-01-01&rft.volume=764&rft.spage=139626&rft.pages=139626-&rft.artnum=139626&rft.issn=0040-6090&rft.eissn=1879-2731&rft_id=info:doi/10.1016/j.tsf.2022.139626&rft_dat=%3Celsevier_cross%3ES0040609022005284%3C/elsevier_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c297t-6f39c9813527b991a7c879ab59e0df0623dbdb72f83c884ca5e6279213c6cdba3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true