Microwave properties of Mg–Zn ferrite deposited by the thermal evaporation technique

• Published in: Vacuum 2020-03, Vol.173, p.109114, Article 109114
• Main Authors: Mezher, Sabah J., Kadhim, Kadhim J., Abdulmunem, Oday Mazin, Mejbel, Mohanad Kadhim
• Format: Article
• Language: English
• Subjects: AFM; SEM; Sol-gel; Spinel ferrite; Thin films; VNA
• ISSN: 0042-207X; 1879-2715
• DOI: 10.1016/j.vacuum.2019.109114

Spinel ferrite samples of Mg0.6Zn0.4Fe2O4 were fabricated using the sol-gel technique. Thermal evaporation in the vacuum technique was used to deposit an (850, 350) ± 30 nm thick layer of this ferrite powder on the glass substrates. The results of XRD, SEM, and AFM showed that the prepared thin films are polycrystalline and nano-sized, with homogeneous particle size and good distribution. The porosity of the films was small, and the occurrence of microstrain on the crystals was observed because of the sintering temperature. Ferrite's thin-film thickness effect on the microwave properties was studied using the Vector Network Analyzer (VNA) in the X-band frequency range of 8–12.5 GHz. The microwave properties increased with increasing film thickness due to the spin-spin interaction process between the incidence waves and the spin-wave. High stability of the reflection, absorption and very high proportions for the two thicknesses is obtained. The resonance peaks for the thin films of spinel ferrite appeared at frequencies of 8.2, 8.4, 8.6, 9.2, 9.8, 10.0, 10.2, 11.2, 11.4, 12.01, and 12.2 GHz. •Spinal ferrite samples of Mg0.6Zn0.4Fe2O4 were prepared using the sol-gel method.•Thermal evaporation in the vacuum is used to deposit (850, 350) ±30 nm thickness from ferrite on the glass substrates.•Samples were tested by XRD, SEM, AFM, and VNA systems.•Prepared thin films are of polycrystalline, nano-size, homogeneity of particle size and its distribution was good.•The sintering temperature for completing the ferrite films structure formation is at 1050 °C.