Deconvolution as a tool to remove fringes from an FT-IR spectrum

Fringes in an FT-IR spectrum, resulting e.g. from internal reflection within a sample window, may seriously hinder spectral analysis. A Fourier filtering procedure is presented as an alternative to interferogram editing or partially least squares procedures for the removal of fringes in an FT-IR spe...

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Bibliographic Details
Published in:Vibrational spectroscopy 2004-10, Vol.36 (1), p.89-95
Main Authors: Pistorius, Arthur M.A., DeGrip, Willem J.
Format: Article
Language:English
Subjects:
Deconvolution
Fourier filtering
Fringes
FT-IR spectroscopy
Internal reflection
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Summary:Fringes in an FT-IR spectrum, resulting e.g. from internal reflection within a sample window, may seriously hinder spectral analysis. A Fourier filtering procedure is presented as an alternative to interferogram editing or partially least squares procedures for the removal of fringes in an FT-IR spectrum. This method is especially useful when the interferogram is not available anymore and the number of absorption bands, present in the spectrum is not exactly known beforehand. The scope and limitations of the method is discussed as well as the choice of the deconvolution parameters.
ISSN:0924-2031
1873-3697
DOI:10.1016/j.vibspec.2004.04.001