Full-field optical coherence microscopy with a sub-nanosecond supercontinuum light source for material research

► Novel application of sub-ns SC sources in full-field optical coherence microscopy (FF-OCM). ► Demonstration of successful use of sub-ns SC sources in FF-OCM for micro-material testing. ► Ultra high resolution imaging and cost efficiency. ► Benefits by complementary information content between FF-O...

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Bibliographic Details
Published in:Optical fiber technology 2012-09, Vol.18 (5), p.403-410
Main Authors: Heise, Bettina, Schausberger, Stefan E., Häuser, Sören, Plank, Bernhard, Salaberger, Dietmar, Leiss-Holzinger, Elisabeth, Stifter, David
Format: Article
Language:English
Subjects:
Broadband supercontinuum light source
Computed tomography
Fiber-filled polymers
Full-field imaging
Image processing
Material science
Optical coherence microscopy
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Summary:► Novel application of sub-ns SC sources in full-field optical coherence microscopy (FF-OCM). ► Demonstration of successful use of sub-ns SC sources in FF-OCM for micro-material testing. ► Ultra high resolution imaging and cost efficiency. ► Benefits by complementary information content between FF-OCM and μ-XCT. ► Advanced image processing. Full-field optical coherence microscopy performed with a supercontinuum light source based on a Q-switched micro-chip laser pumped photonic crystal fiber is shown to provide ultra-high resolution images from the interior of scattering samples. We exemplify our imaging approach by a detailed analysis of fiber reinforced polymer samples: comparative analysis by X-ray computed tomography as well as advanced data processing of the obtained 3D data is used to retrieve information on physical parameters like fiber orientation and distribution of point defect structures.
ISSN:1068-5200
1095-9912
DOI:10.1016/j.yofte.2012.07.011