Reliability of Complex Devices in Random Environments

The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. We introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory co...

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Bibliographic Details
Published in:Probability in the engineering and informational sciences 1987-01, Vol.1 (1), p.97-115
Main Authors: Çinlar, E., Özekici, S.
Format: Article
Language:English
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Summary:The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. We introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory conditions. The computations needed for randomly varying conditions are recursive and can be used for making decisions regarding maintenance and replacement.
ISSN:0269-9648
1469-8951
DOI:10.1017/S0269964800000322