Sub-Ångstrom and sub-eV resolution with the analytical SATEM

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S03), p.6-7
Main Authors: Benner, G., Matijevic, M., Orchowski, A., Schlossmacher, P., Thesen, A., Haider, M., Hartel, P.
Format: Article
Language:English
Subjects:
Improvements in STEM and TEM Instrumentation for Materials Science Applications
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760455585X