Three-Dimensional Nanoscale Characterization of Pt Deposition from an Organometallic Precursor Induced by a Focused Ion Beam

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Bibliographic Details
Published in:Microscopy and microanalysis 2006-08, Vol.12 (S02), p.1252-1253
Main Authors: Gerstl, SA, Morrone, A, Kvitek, R
Format: Article
Language:English
Subjects:
FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927606068450