ZEISS Crossbeam - Advancing Capabilities in High Throughput 3D Analysis and Sample Preparation

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Bibliographic Details
Published in:Microscopy and microanalysis 2017-07, Vol.23 (S1), p.8-9
Main Authors: Volkenandt, Tobias, Perez-Willard, Fabian, Rauscher, Michael, Maria Anger, Pascal
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Vendor Symposium
Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927617000721