Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems

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Bibliographic Details
Published in:Microscopy and microanalysis 2017-07, Vol.23 (S1), p.40-41
Main Authors: Ulfig, Robert M., Prosa, Ty J., Chen, Yimeng, Rice, Katherine P., Martin, Isabelle, Reinhard, David A., Gieser, Brian P., Oltman, Edward, Lenz, Dan R., Bunton, Joseph, Van Dyke, Michael, Kelly, Thomas F., Larson, David J.
Format: Article
Language:English
Subjects:
Analytical and Instrumentation Science Symposia
Vendor Symposium
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927617000885