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Under-sampling and Image Reconstruction for Scanning Electron Microscopes

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Bibliographic Details
Published in:	Microscopy and microanalysis 2017-07, Vol.23 (S1), p.136-137
Main Authors:	Zhang, Yan, Godaliyadda, G.M. Dilshan, Nashed, Youssef S. G., Ferrier, Nicola, Begum Gulsoy, Emine, Phatak, Charudatta
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Compressive Sensing, Machine Learning & Advanced Computation in Microscopy
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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