Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy

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Bibliographic Details
Published in:Microscopy and microanalysis 2017-07, Vol.23 (S1), p.464-465
Main Authors: Oxley, Mark P., Cross, Nicholas G., Duscher, Gerd, Allen, Leslie J., Chisholm, Matthew F.
Format: Article
Language:English
Subjects:
Advances and Applications of Aberration-Corrected Electron Microscopy
Analytical and Instrumentation Science Symposia
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927617003002