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Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application

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Bibliographic Details
Published in:	Microscopy and microanalysis 2017-07, Vol.23 (S1), p.542-543
Main Authors:	Wollschläger, Nicole, Häusler, Ines, Ortel, Erik, Hodoroaba, Vasile-Dan, Palasse, Laurie, Dirscherl, Kai
Format:	Article
Language:	English
Subjects:	Advances in Scanning Electron Microscopy: Transmission Modes and Channeling Effects Analytical and Instrumentation Science Symposia
Citations:	Items that this one cites
Online Access:	Get full text
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