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The Future of Direct Electron Detection in Cryo-TEM

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Bibliographic Details
Published in:	Microscopy and microanalysis 2017-07, Vol.23 (S1), p.838-839
Main Authors:	van Duinen, Gijs, Yu, Lingbo, Franken, Erik, Kuijper, Maarten, Roeven, Hans, Janssen, Bart
Format:	Article
Language:	English
Subjects:	Analytical and Instrumentation Science Symposia Pushing the Limits of Cryo-TEM: Development and Applications
Citations:	Items that this one cites
Online Access:	Get full text
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