The Future of Direct Electron Detection in Cryo-TEM

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Published in:Microscopy and microanalysis 2017-07, Vol.23 (S1), p.838-839
Main Authors: van Duinen, Gijs, Yu, Lingbo, Franken, Erik, Kuijper, Maarten, Roeven, Hans, Janssen, Bart
Format: Article
Language:English
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Analytical and Instrumentation Science Symposia
Pushing the Limits of Cryo-TEM: Development and Applications
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container_title Microscopy and microanalysis
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creator van Duinen, Gijs
Yu, Lingbo
Franken, Erik
Kuijper, Maarten
Roeven, Hans
Janssen, Bart
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doi_str_mv 10.1017/S1431927617004858
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subjects Analytical and Instrumentation Science Symposia
Pushing the Limits of Cryo-TEM: Development and Applications
title The Future of Direct Electron Detection in Cryo-TEM
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