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Exploring Endohedral Metallofullerenes for Advanced Thin-Film Device Applications toward Next-Generation Electronics

Endohedral metallofullerenes (EMFs) showcase unique properties such as their capacity to stabilize isolated metal atoms and reactive metal clusters, rendering them highly appealing for diverse applications, most notably in electronic devices. This perspective examines EMFs in next-generation thin-fi...

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Bibliographic Details
Published in:Chemistry of materials 2023-10, Vol.35 (20), p.8323-8337
Main Authors: Nam, Jeong-Seok, Seo, Youngho, Han, Jiye, Lee, Jang Woo, Kim, Kyusun, Rane, Tushar, Kim, Hyung Do, Jeon, Il
Format: Article
Language:English
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Summary:Endohedral metallofullerenes (EMFs) showcase unique properties such as their capacity to stabilize isolated metal atoms and reactive metal clusters, rendering them highly appealing for diverse applications, most notably in electronic devices. This perspective examines EMFs in next-generation thin-film devices, highlighting significant discoveries in device applications that incorporate EMFs. It casts a spotlight on significant advancements in device applications that integrate EMFs, with an acute focus on device performance and the crucial role of high crystallinity in achieving peak efficiency. It postulates that tailoring the size or functional groups of the fullerene cage may fulfill these needs and, in turn, transform the electrical properties of these devices. This perspective emphasizes the pressing need for more in-depth research to surmount existing limitations. The devices scrutinized in this review include organic field-effect transistors, photodetectors, organic photovoltaics, and perovskite photovoltaics. The use of EMFs in these diverse device structures is explored, concentrating on performance issues and the necessity for enhancements in select electrical and chemical properties for peak efficiency and functionality. This review serves as an exceptional resource and benchmark for fullerene researchers aiming to probe the application of EMFs in devices.
ISSN:0897-4756
1520-5002
DOI:10.1021/acs.chemmater.3c01192