Operando Characterization of Electrochemistry at the Rutile TiO 2 (110)/0.1 M HCl Interface Using Ambient Pressure XPS

Ambient pressure X-ray photoelectron spectroscopy (AP-XPS) was employed to investigate the effect of applied potential on the interface of TiO (110) with 0.1 M HCl. The study, which involved operando electrochemical characterization, enabled real-time monitoring and analysis of electrochemical proce...

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Bibliographic Details
Published in:Journal of physical chemistry. C 2024-12, Vol.128 (49), p.20933
Main Authors: Yu, Jiangdong, Byrne, Conor, Imran, Jameel, Henderson, Zoë, Holt, Katherine B, Large, Alexander I, Held, Georg, Walton, Alex, Thornton, Geoff
Format: Article
Language:English
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Summary:Ambient pressure X-ray photoelectron spectroscopy (AP-XPS) was employed to investigate the effect of applied potential on the interface of TiO (110) with 0.1 M HCl. The study, which involved operando electrochemical characterization, enabled real-time monitoring and analysis of electrochemical processes. There is a significant influence on the interface composition; in particular, the surface Cl surface coverage varies with electrochemical potential. Moreover, there appears to be a reaction of evolved Cl with adventitious carbon to form C-Cl and C-Cl species.
ISSN:1932-7447
1932-7455
DOI:10.1021/acs.jpcc.4c07173