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In Situ Monitoring of H 2 -Induced Nonstoichiometry in Cu 2 O
Using ambient-pressure X-ray photoelectron spectroscopy and Auger electron spectroscopy to monitor the reduction of Cu O in H , we identify the formation of an intermediate, oxygen-deficient Cu O phase and its progressive inward growth into the deeper region of the oxide. Complemented by atomistic m...
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Published in: | The journal of physical chemistry letters 2022-06, Vol.13 (24), p.5597-5604 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Using ambient-pressure X-ray photoelectron spectroscopy and Auger electron spectroscopy to monitor the reduction of Cu
O in H
, we identify the formation of an intermediate, oxygen-deficient Cu
O phase and its progressive inward growth into the deeper region of the oxide. Complemented by atomistic modeling, we show that the oxygen-deficient Cu
O formation occurs via molecular H
adsorption at the Cu
O surface, which results in the loss of lattice oxygen from the formation of H
O molecules that desorb spontaneously from the oxide surface. The resulting oxygen-deficient Cu
O is a stable intermediate that persists before the Cu
O is fully reduced to metallic Cu. The oxygen vacancy-induced charge of the coordinating Cu atoms results in a satellite feature in Cu LMM, which can be used as a fingerprint to identify nonstoichiometry in oxides and local charge transfer induced by the nonstoichiometry. |
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ISSN: | 1948-7185 1948-7185 |
DOI: | 10.1021/acs.jpclett.2c00988 |