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Low-Temperature Deposition of Inorganic–Organic HfO 2 –PMMA Hybrid Gate Dielectric Layers for High-Mobility ZnO Thin-Film Transistors
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Published in: | ACS applied electronic materials 2019-06, Vol.1 (6), p.1003-1011 |
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Main Authors: | , , , , , |
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Language: | English |
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container_end_page | 1011 |
container_issue | 6 |
container_start_page | 1003 |
container_title | ACS applied electronic materials |
container_volume | 1 |
creator | Mullapudi, Gouri Syamala Rao Velazquez-Nevarez, Gonzalo Alonso Avila-Avendano, Carlos Torres-Ochoa, Jorge Alejandro Quevedo-López, Manuel Angel Ramírez-Bon, Rafael |
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doi_str_mv | 10.1021/acsaelm.9b00175 |
format | article |
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source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
title | Low-Temperature Deposition of Inorganic–Organic HfO 2 –PMMA Hybrid Gate Dielectric Layers for High-Mobility ZnO Thin-Film Transistors |
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