Exchange of Ions across the TiN/TaO x Interface during Electroformation of TaO x -Based Resistive Switching Devices

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Bibliographic Details
Published in:ACS applied materials & interfaces 2020-06, Vol.12 (24), p.27378-27385
Main Authors: Ma, Yuanzhi, Cullen, David A., Goodwill, Jonathan M., Xu, Qiyun, More, Karren L., Skowronski, Marek
Format: Article
Language:English
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ISSN:1944-8244
1944-8252
DOI:10.1021/acsami.0c06960