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The Intermetallic Semiconductor ht -IrGa 3 : a Material in the in-Transformation State
The compound IrGa was synthesized by direct reaction of the elements. It is formed as a high-temperature phase in the Ir-Ga system. Single-crystal X-ray diffraction analysis confirms the tetragonal symmetry (space group 4 , No. 136) with = 6.4623(1) Å and = 6.5688(2) Å and reveals strong disorder in...
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Published in: | ACS Materials Au 2022-01, Vol.2 (1), p.45-54 |
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creator | Cardoso-Gil, Raúl Zelenina, Iryna Stahl, Quirin E Bobnar, Matej Koželj, Primož Krnel, Mitja Burkhardt, Ulrich Veremchuk, Igor Simon, Paul Carrillo-Cabrera, Wilder Boström, Magnus Grin, Yuri |
description | The compound IrGa
was synthesized by direct reaction of the elements. It is formed as a high-temperature phase in the Ir-Ga system. Single-crystal X-ray diffraction analysis confirms the tetragonal symmetry (space group
4
, No. 136) with
= 6.4623(1) Å and
= 6.5688(2) Å and reveals strong disorder in the crystal structure, reflected in the huge values and anisotropy of the atomic displacement parameters. A model for the real crystal structure of
-IrGa
is derived by the split-position approach from the single-crystal X-ray diffraction data and confirmed by an atomic-resolution transmission electron microscopy study. Temperature-dependent electrical resistivity measurements evidence semiconductor behavior with a band gap of 30 meV. A thermoelectric characterization was performed for
-IrGa
and for the solid solution IrGa
Zn
. |
doi_str_mv | 10.1021/acsmaterialsau.1c00025 |
format | article |
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was synthesized by direct reaction of the elements. It is formed as a high-temperature phase in the Ir-Ga system. Single-crystal X-ray diffraction analysis confirms the tetragonal symmetry (space group
4
, No. 136) with
= 6.4623(1) Å and
= 6.5688(2) Å and reveals strong disorder in the crystal structure, reflected in the huge values and anisotropy of the atomic displacement parameters. A model for the real crystal structure of
-IrGa
is derived by the split-position approach from the single-crystal X-ray diffraction data and confirmed by an atomic-resolution transmission electron microscopy study. Temperature-dependent electrical resistivity measurements evidence semiconductor behavior with a band gap of 30 meV. A thermoelectric characterization was performed for
-IrGa
and for the solid solution IrGa
Zn
.</description><identifier>ISSN: 2694-2461</identifier><identifier>EISSN: 2694-2461</identifier><identifier>DOI: 10.1021/acsmaterialsau.1c00025</identifier><identifier>PMID: 36855699</identifier><language>eng</language><publisher>United States</publisher><ispartof>ACS Materials Au, 2022-01, Vol.2 (1), p.45-54</ispartof><rights>2021 The Authors. Published by American Chemical Society.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1239-cd7d095df10af1a9ae69fcc20e66e0acc054828d96c0be3de1b894a73c4a125b3</citedby><cites>FETCH-LOGICAL-c1239-cd7d095df10af1a9ae69fcc20e66e0acc054828d96c0be3de1b894a73c4a125b3</cites><orcidid>0000-0003-1115-4024 ; 0000-0003-3891-9584 ; 0000-0003-1706-1910 ; 0000-0002-0748-981X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/36855699$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Cardoso-Gil, Raúl</creatorcontrib><creatorcontrib>Zelenina, Iryna</creatorcontrib><creatorcontrib>Stahl, Quirin E</creatorcontrib><creatorcontrib>Bobnar, Matej</creatorcontrib><creatorcontrib>Koželj, Primož</creatorcontrib><creatorcontrib>Krnel, Mitja</creatorcontrib><creatorcontrib>Burkhardt, Ulrich</creatorcontrib><creatorcontrib>Veremchuk, Igor</creatorcontrib><creatorcontrib>Simon, Paul</creatorcontrib><creatorcontrib>Carrillo-Cabrera, Wilder</creatorcontrib><creatorcontrib>Boström, Magnus</creatorcontrib><creatorcontrib>Grin, Yuri</creatorcontrib><title>The Intermetallic Semiconductor ht -IrGa 3 : a Material in the in-Transformation State</title><title>ACS Materials Au</title><addtitle>ACS Mater Au</addtitle><description>The compound IrGa
was synthesized by direct reaction of the elements. It is formed as a high-temperature phase in the Ir-Ga system. Single-crystal X-ray diffraction analysis confirms the tetragonal symmetry (space group
4
, No. 136) with
= 6.4623(1) Å and
= 6.5688(2) Å and reveals strong disorder in the crystal structure, reflected in the huge values and anisotropy of the atomic displacement parameters. A model for the real crystal structure of
-IrGa
is derived by the split-position approach from the single-crystal X-ray diffraction data and confirmed by an atomic-resolution transmission electron microscopy study. Temperature-dependent electrical resistivity measurements evidence semiconductor behavior with a band gap of 30 meV. A thermoelectric characterization was performed for
-IrGa
and for the solid solution IrGa
Zn
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was synthesized by direct reaction of the elements. It is formed as a high-temperature phase in the Ir-Ga system. Single-crystal X-ray diffraction analysis confirms the tetragonal symmetry (space group
4
, No. 136) with
= 6.4623(1) Å and
= 6.5688(2) Å and reveals strong disorder in the crystal structure, reflected in the huge values and anisotropy of the atomic displacement parameters. A model for the real crystal structure of
-IrGa
is derived by the split-position approach from the single-crystal X-ray diffraction data and confirmed by an atomic-resolution transmission electron microscopy study. Temperature-dependent electrical resistivity measurements evidence semiconductor behavior with a band gap of 30 meV. A thermoelectric characterization was performed for
-IrGa
and for the solid solution IrGa
Zn
.</abstract><cop>United States</cop><pmid>36855699</pmid><doi>10.1021/acsmaterialsau.1c00025</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0003-1115-4024</orcidid><orcidid>https://orcid.org/0000-0003-3891-9584</orcidid><orcidid>https://orcid.org/0000-0003-1706-1910</orcidid><orcidid>https://orcid.org/0000-0002-0748-981X</orcidid></addata></record> |
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title | The Intermetallic Semiconductor ht -IrGa 3 : a Material in the in-Transformation State |
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