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Charge Density and pH Effects on Polycation Adsorption on Poly-Si, SiO 2 , and Si 3 N 4 Films and Impact on Removal During Chemical Mechanical Polishing
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Published in: | ACS applied materials & interfaces 2011-10, Vol.3 (10), p.4126-4132 |
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Language: | English |
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container_end_page | 4132 |
container_issue | 10 |
container_start_page | 4126 |
container_title | ACS applied materials & interfaces |
container_volume | 3 |
creator | Penta, Naresh K. Veera, P. R. Dandu Babu, S. V. |
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doi_str_mv | 10.1021/am2010114 |
format | article |
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source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
title | Charge Density and pH Effects on Polycation Adsorption on Poly-Si, SiO 2 , and Si 3 N 4 Films and Impact on Removal During Chemical Mechanical Polishing |
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