An In-Situ Synchrotron X-ray Diffraction Tomography Study of Crystallization and Preferred Crystal Orientation in a Stirred Reactor

A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to crystallite shape/size characteristics; in particular, stirring induces pronounc...

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Bibliographic Details
Published in:Crystal growth & design 2005-03, Vol.5 (2), p.395-397
Main Authors: Jacques, S. D. M, Pile, K, Barnes, P, Lai, X, Roberts, K. J, Williams, R. A
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Crystalline state (including molecular motions in solids)
Crystallographic aspects of phase transformations
pressure effects
Exact sciences and technology
Physics
Structure of solids and liquids
crystallography
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Summary:A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to crystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.
ISSN:1528-7483
1528-7505
DOI:10.1021/cg0497288