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Infrared spectroscopic study of thin films of poly(methylsilane), its oxidation, and its transformation into poly(carbosilane) on the surfaces of silicon single-crystal wafers

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Bibliographic Details
Published in:Chemistry of materials 1994-07, Vol.6 (7), p.977-982
Main Authors: Scarlete, Mihai, Brienne, Stephane, Butler, Ian S, Harrod, John F
Format: Article
Language:English
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ISSN:0897-4756
1520-5002
DOI:10.1021/cm00043a020