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Atomic Layer Deposition of Hafnium Dioxide Films from 1-Methoxy-2-methyl-2-propanolate Complex of Hafnium
HfO2 films were grown by atomic layer deposition from a mononuclear and volatile complex Hf(OCMe2CH2OMe)4 in the temperature range of 275−425 °C on borosilicate glass and Si(100) substrates. HfO2 films were formed as a result of alternate adsorption and hydrolysis steps of the hafnium precursor. The...
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Published in: | Chemistry of materials 2003-04, Vol.15 (8), p.1722-1727 |
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container_end_page | 1727 |
container_issue | 8 |
container_start_page | 1722 |
container_title | Chemistry of materials |
container_volume | 15 |
creator | Kukli, Kaupo Ritala, Mikko Leskelä, Markku Sajavaara, Timo Keinonen, Juhani Jones, Anthony C Roberts, John L |
description | HfO2 films were grown by atomic layer deposition from a mononuclear and volatile complex Hf(OCMe2CH2OMe)4 in the temperature range of 275−425 °C on borosilicate glass and Si(100) substrates. HfO2 films were formed as a result of alternate adsorption and hydrolysis steps of the hafnium precursor. The adsorption of hafnium complex was not entirely self-limiting, probably because of the thermal decomposition of the precursors. Crystalline films containing the monoclinic HfO2 phase were grown at temperatures exceeding 300−325 °C. The refractive index of the films varied between 1.8 and 2.0. The effective permittivities of the dielectrics in Al/HfO2/Si structures varied between 12 and 17. |
doi_str_mv | 10.1021/cm021328p |
format | article |
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Mater</addtitle><date>2003-04-22</date><risdate>2003</risdate><volume>15</volume><issue>8</issue><spage>1722</spage><epage>1727</epage><pages>1722-1727</pages><issn>0897-4756</issn><eissn>1520-5002</eissn><abstract>HfO2 films were grown by atomic layer deposition from a mononuclear and volatile complex Hf(OCMe2CH2OMe)4 in the temperature range of 275−425 °C on borosilicate glass and Si(100) substrates. HfO2 films were formed as a result of alternate adsorption and hydrolysis steps of the hafnium precursor. The adsorption of hafnium complex was not entirely self-limiting, probably because of the thermal decomposition of the precursors. Crystalline films containing the monoclinic HfO2 phase were grown at temperatures exceeding 300−325 °C. The refractive index of the films varied between 1.8 and 2.0. 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subjects | Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics |
title | Atomic Layer Deposition of Hafnium Dioxide Films from 1-Methoxy-2-methyl-2-propanolate Complex of Hafnium |
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