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Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist
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Published in: | Chemistry of materials 2008-04, Vol.20 (7), p.2602-2602 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
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container_end_page | 2602 |
container_issue | 7 |
container_start_page | 2602 |
container_title | Chemistry of materials |
container_volume | 20 |
creator | Wong, Sean H Thiel, Michael Brodersen, Peter Fenske, Dieter Ozin, Geoffrey A Wegener, Martin von Freymann, Georg |
description | |
doi_str_mv | 10.1021/cm800624g |
format | article |
fullrecord | <record><control><sourceid>istex_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1021_cm800624g</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ark_67375_TPS_9R3DMRSX_6</sourcerecordid><originalsourceid>FETCH-LOGICAL-a262t-9b358041f9e271aa4f771e9e64ccc72e22b3d32038c3291366702cf1d6d11acb3</originalsourceid><addsrcrecordid>eNpt0E1LAzEQBuAgCtbqwX-QiwcP0XzsJrvHotUKftFW9BbSdLaNbjeSZMXin3dLpSdPw8w8DMOL0CmjF4xydmlXBaWSZ4s91GM5pySnlO-jHi1KRTKVy0N0FOM7pazjRQ_9jNxiWa_xBGqwyX0BfoWEh8kuceUD3mzJGKKv2-R8g6fLAECu3Qqa2PWmxo-m8TGF1qY2QMSuwYMQoXEWT9q6cnPAg7omd40PC7OZPi998p10MR2jg8rUEU7-ah-93AynVyNy_3R7dzW4J4ZLnkg5E3lBM1aVwBUzJquUYlCCzKy1igPnMzEXnIrCCl4yIaWi3FZsLueMGTsTfXS-vWuDjzFApT-DW5mw1ozqTWp6l1pnydZ2_8H3DprwoaUSKtfT54kux-L6YTx507LzZ1tvbNTvvg1dJvGfu7_yyHxU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist</title><source>American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list)</source><creator>Wong, Sean H ; Thiel, Michael ; Brodersen, Peter ; Fenske, Dieter ; Ozin, Geoffrey A ; Wegener, Martin ; von Freymann, Georg</creator><creatorcontrib>Wong, Sean H ; Thiel, Michael ; Brodersen, Peter ; Fenske, Dieter ; Ozin, Geoffrey A ; Wegener, Martin ; von Freymann, Georg</creatorcontrib><identifier>ISSN: 0897-4756</identifier><identifier>EISSN: 1520-5002</identifier><identifier>DOI: 10.1021/cm800624g</identifier><language>eng</language><publisher>American Chemical Society</publisher><ispartof>Chemistry of materials, 2008-04, Vol.20 (7), p.2602-2602</ispartof><rights>Copyright © 2008 American Chemical Society</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a262t-9b358041f9e271aa4f771e9e64ccc72e22b3d32038c3291366702cf1d6d11acb3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Wong, Sean H</creatorcontrib><creatorcontrib>Thiel, Michael</creatorcontrib><creatorcontrib>Brodersen, Peter</creatorcontrib><creatorcontrib>Fenske, Dieter</creatorcontrib><creatorcontrib>Ozin, Geoffrey A</creatorcontrib><creatorcontrib>Wegener, Martin</creatorcontrib><creatorcontrib>von Freymann, Georg</creatorcontrib><title>Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist</title><title>Chemistry of materials</title><addtitle>Chem. Mater</addtitle><issn>0897-4756</issn><issn>1520-5002</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNpt0E1LAzEQBuAgCtbqwX-QiwcP0XzsJrvHotUKftFW9BbSdLaNbjeSZMXin3dLpSdPw8w8DMOL0CmjF4xydmlXBaWSZ4s91GM5pySnlO-jHi1KRTKVy0N0FOM7pazjRQ_9jNxiWa_xBGqwyX0BfoWEh8kuceUD3mzJGKKv2-R8g6fLAECu3Qqa2PWmxo-m8TGF1qY2QMSuwYMQoXEWT9q6cnPAg7omd40PC7OZPi998p10MR2jg8rUEU7-ah-93AynVyNy_3R7dzW4J4ZLnkg5E3lBM1aVwBUzJquUYlCCzKy1igPnMzEXnIrCCl4yIaWi3FZsLueMGTsTfXS-vWuDjzFApT-DW5mw1ozqTWp6l1pnydZ2_8H3DprwoaUSKtfT54kux-L6YTx507LzZ1tvbNTvvg1dJvGfu7_yyHxU</recordid><startdate>20080408</startdate><enddate>20080408</enddate><creator>Wong, Sean H</creator><creator>Thiel, Michael</creator><creator>Brodersen, Peter</creator><creator>Fenske, Dieter</creator><creator>Ozin, Geoffrey A</creator><creator>Wegener, Martin</creator><creator>von Freymann, Georg</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080408</creationdate><title>Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist</title><author>Wong, Sean H ; Thiel, Michael ; Brodersen, Peter ; Fenske, Dieter ; Ozin, Geoffrey A ; Wegener, Martin ; von Freymann, Georg</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a262t-9b358041f9e271aa4f771e9e64ccc72e22b3d32038c3291366702cf1d6d11acb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wong, Sean H</creatorcontrib><creatorcontrib>Thiel, Michael</creatorcontrib><creatorcontrib>Brodersen, Peter</creatorcontrib><creatorcontrib>Fenske, Dieter</creatorcontrib><creatorcontrib>Ozin, Geoffrey A</creatorcontrib><creatorcontrib>Wegener, Martin</creatorcontrib><creatorcontrib>von Freymann, Georg</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>Chemistry of materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wong, Sean H</au><au>Thiel, Michael</au><au>Brodersen, Peter</au><au>Fenske, Dieter</au><au>Ozin, Geoffrey A</au><au>Wegener, Martin</au><au>von Freymann, Georg</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist</atitle><jtitle>Chemistry of materials</jtitle><addtitle>Chem. Mater</addtitle><date>2008-04-08</date><risdate>2008</risdate><volume>20</volume><issue>7</issue><spage>2602</spage><epage>2602</epage><pages>2602-2602</pages><issn>0897-4756</issn><eissn>1520-5002</eissn><pub>American Chemical Society</pub><doi>10.1021/cm800624g</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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ispartof | Chemistry of materials, 2008-04, Vol.20 (7), p.2602-2602 |
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source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
title | Highly Selective Wet Etch for High-Resolution Three-Dimensional Nanostructures in Arsenic Sulfide All-Inorganic Photoresist |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-22T10%3A06%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-istex_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Highly%20Selective%20Wet%20Etch%20for%20High-Resolution%20Three-Dimensional%20Nanostructures%20in%20Arsenic%20Sulfide%20All-Inorganic%20Photoresist&rft.jtitle=Chemistry%20of%20materials&rft.au=Wong,%20Sean%20H&rft.date=2008-04-08&rft.volume=20&rft.issue=7&rft.spage=2602&rft.epage=2602&rft.pages=2602-2602&rft.issn=0897-4756&rft.eissn=1520-5002&rft_id=info:doi/10.1021/cm800624g&rft_dat=%3Cistex_cross%3Eark_67375_TPS_9R3DMRSX_6%3C/istex_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-a262t-9b358041f9e271aa4f771e9e64ccc72e22b3d32038c3291366702cf1d6d11acb3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |