Characterization of Polystyrene on Etched Silver Using Ion Scattering and X-ray Photoelectron Spectroscopy: Correlation of Secondary Ion Yield in Time-of-Flight SIMS with Surface Coverage

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Bibliographic Details
Published in:Journal of physical chemistry (1952) 1994-11, Vol.98 (44), p.11570-11575
Main Authors: Muddiman, David C, Brockman, Adam H, Proctor, Andrew, Houalla, Marwan, Hercules, David M
Format: Article
Language:English
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ISSN:0022-3654
1541-5740
DOI:10.1021/j100095a044