Molecular Orientation in Vacuum-Deposited Peralkyloligosilane Thin Films

Linear oligosilanes (R(SiR2)10R), permethyldecasilane (R = CH3), and perpropyldecasilane (R = C3H7), were vacuum-deposited onto quartz substrates under various conditions. Molecular orientation in the deposited thin films was investigated by X-ray diffractometry and absorption spectroscopy with a va...

Full description

Saved in:
Bibliographic Details
Published in:The journal of physical chemistry. B 2001-05, Vol.105 (19), p.4111-4117
Main Authors: Ichino, Yoshiro, Minami, Nobutsugu, Yatabe, Tetsuo, Obata, Kuninori, Kira, Mitsuo
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Linear oligosilanes (R(SiR2)10R), permethyldecasilane (R = CH3), and perpropyldecasilane (R = C3H7), were vacuum-deposited onto quartz substrates under various conditions. Molecular orientation in the deposited thin films was investigated by X-ray diffractometry and absorption spectroscopy with a varying incident angle to the substrate. Two types of highly ordered multilayered structures, one with molecular orientation normal to the substrate and the other with oblique orientation, were observed in the permethyldecasilane thin films deposited at room temperature. When deposited at −150 °C, on the other hand, the molecular orientation was largely normal to the substrates but the multilayered structure was hardly formed. For perpropyldecasilane thin films, an interdigitated structure with molecular orientation normal to the substrate was found when deposited at and above room temperatures.
ISSN:1520-6106
1520-5207
DOI:10.1021/jp002503x