Absolute Molecular Orientational Distribution of the Polystyrene Surface

Vibrationally resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characterization of the dependence of the VR-SFG on film thickn...

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Bibliographic Details
Published in:The journal of physical chemistry. B 2001-04, Vol.105 (14), p.2785-2791
Main Authors: Briggman, Kimberly A, Stephenson, John C, Wallace, William E, Richter, Lee J
Format: Article
Language:English
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Summary:Vibrationally resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characterization of the dependence of the VR-SFG on film thickness allows unique identification of the origin of the signal, e.g., free surface, bulk, or buried interface. For films
ISSN:1520-6106
1520-5207
DOI:10.1021/jp0037495