High-Resolution Line Width Measurement of Single CdSe Nanocrystals at Long Time Scales

Band-edge photoluminescence from single CdSe/CdZnS nanocrystals was analyzed using a confocal Fabry−Perot spectrometer with long exposure times. Due to spectral diffusion, direct detection of the line shape was not possible. However, the contrast observed in the resulting signal provided a rigorous...

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Bibliographic Details
Published in:Journal of physical chemistry. C 2009-04, Vol.113 (14), p.5345-5348
Main Authors: Littleton, Bradley N., Fernée, Mark J., Gómez, Daniel E., Mulvaney, Paul, Rubinsztein-Dunlop, Halina
Format: Article
Language:English
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Summary:Band-edge photoluminescence from single CdSe/CdZnS nanocrystals was analyzed using a confocal Fabry−Perot spectrometer with long exposure times. Due to spectral diffusion, direct detection of the line shape was not possible. However, the contrast observed in the resulting signal provided a rigorous upper bound to the single nanocrystal line width as low as 20.7 ± 0.5 μeV. This result is in excellent agreement with an asymptotic upper limit to the spectral diffusion broadened line width found at millisecond time scales, extending this time scale by 4 orders of magnitude. This indicates that spectral diffusion commonly observed at long time scales results from a physical process different from that/those responsible for the asymptotic limit.
ISSN:1932-7447
1932-7455
DOI:10.1021/jp900887r