Scanning Force Microscopies Can Image Patterned Self-Assembled Monolayers

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Bibliographic Details
Published in:Langmuir 1995-03, Vol.11 (3), p.825-831
Main Authors: Wilbur, James L, Biebuyck, Hans A, MacDonald, John C, Whitesides, George M
Format: Article
Language:English
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ISSN:0743-7463
1520-5827
DOI:10.1021/la00003a025