Sensitivity of Frictional Forces to pH on a Nanometer Scale: A Lateral Force Microscopy Study

Saved in:
Bibliographic Details
Published in:Langmuir 1995-12, Vol.11 (12), p.4632-4635
Main Authors: Marti, A, Haehner, G, Spencer, N. D
Format: Article
Language:English
Subjects:
Exact sciences and technology
Friction force microscopes
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components and techniques
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0743-7463
1520-5827
DOI:10.1021/la00012a009