X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface

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Bibliographic Details
Published in:Langmuir 2003-12, Vol.19 (26), p.10997-10999
Main Authors: Kubowicz, Stephan, Thünemann, Andreas F, Geue, Thomas M, Pietsch, Ullrich, Watson, Mark D, Tchebotareva, Natalia, Müllen, Klaus
Format: Article
Language:English
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ISSN:0743-7463
1520-5827
DOI:10.1021/la035210e