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X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface
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Published in: | Langmuir 2003-12, Vol.19 (26), p.10997-10999 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
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container_end_page | 10999 |
container_issue | 26 |
container_start_page | 10997 |
container_title | Langmuir |
container_volume | 19 |
creator | Kubowicz, Stephan Thünemann, Andreas F Geue, Thomas M Pietsch, Ullrich Watson, Mark D Tchebotareva, Natalia Müllen, Klaus |
description | |
doi_str_mv | 10.1021/la035210e |
format | article |
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identifier | ISSN: 0743-7463 |
ispartof | Langmuir, 2003-12, Vol.19 (26), p.10997-10999 |
issn | 0743-7463 1520-5827 |
language | eng |
recordid | cdi_crossref_primary_10_1021_la035210e |
source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
title | X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface |
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