A Quantitative Study of PCBM Diffusion during Annealing of P3HT:PCBM Blend Films

Scanning transmission X-ray microscopy has been used to quantitatively map the composition of P3HT:PCBM blend films in the vicinity of PCBM crystals formed during annealing at 140 °C. The observed PCBM concentration profiles around these crystals have been fitted to Fick’s second law of diffusion an...

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Bibliographic Details
Published in:Macromolecules 2009-11, Vol.42 (21), p.8392-8397
Main Authors: Watts, Benjamin, Belcher, Warwick J, Thomsen, Lars, Ade, Harald, Dastoor, Paul C
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Miscellaneous
Organic polymers
Physicochemistry of polymers
Properties and characterization
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Summary:Scanning transmission X-ray microscopy has been used to quantitatively map the composition of P3HT:PCBM blend films in the vicinity of PCBM crystals formed during annealing at 140 °C. The observed PCBM concentration profiles around these crystals have been fitted to Fick’s second law of diffusion and the diffusion constant found to be 2.5 × 10−14 m2 s−1. The PCBM concentration at the crystal boundary was found to be 19% (v/v) and is interpreted, together with the annealing temperature of 140 °C, as a point on the bimodal line of the composition−temperature phase diagram. The diffusion of PCBM through P3HT is observed to be bulk-dominated, in contrast to the surface/interface-dominated diffusion observed in MDMO-PPV:PCBM blend films by Yang et al. ,
ISSN:0024-9297
1520-5835
DOI:10.1021/ma901444u