Precision-Cut Crystalline Silicon Nanodots and Nanorods from Nanowires and Direct Visualization of Cross Sections and Growth Orientations of Silicon Nanowires

An easy and convenient method, using the well-established microtome technique, has been developed to precision cut nanowires into nanodots of well-defined sizes and shapes. The technique allows the determination of the growth direction, the shape of the cross section, the internal atomic structure (...

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Bibliographic Details
Published in:Nano letters 2003-12, Vol.3 (12), p.1735-1737
Main Authors: Teo, Boon K, Sun, X. H, Hung, T. F, Meng, X. M, Wong, N. B, Lee, S. T
Format: Article
Language:English
Subjects:
Applied sciences
Cross-disciplinary physics: materials science
rheology
Electronics
Exact sciences and technology
Materials science
Molecular electronics, nanoelectronics
Nanoscale materials and structures: fabrication and characterization
Physics
Quantum wires
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Summary:An easy and convenient method, using the well-established microtome technique, has been developed to precision cut nanowires into nanodots of well-defined sizes and shapes. The technique allows the determination of the growth direction, the shape of the cross section, the internal atomic structure (including twinning or other stacking faults, if any) of single nanowires. In our experiments, both the coaxial structure of vertical cross section of normal silicon nanowires (SiNWs) and horizontal cross section of necklace-like SiNWs were obtained and examined under TEM.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl034603v