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Precision-Cut Crystalline Silicon Nanodots and Nanorods from Nanowires and Direct Visualization of Cross Sections and Growth Orientations of Silicon Nanowires
An easy and convenient method, using the well-established microtome technique, has been developed to precision cut nanowires into nanodots of well-defined sizes and shapes. The technique allows the determination of the growth direction, the shape of the cross section, the internal atomic structure (...
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Published in: | Nano letters 2003-12, Vol.3 (12), p.1735-1737 |
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container_end_page | 1737 |
container_issue | 12 |
container_start_page | 1735 |
container_title | Nano letters |
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creator | Teo, Boon K Sun, X. H Hung, T. F Meng, X. M Wong, N. B Lee, S. T |
description | An easy and convenient method, using the well-established microtome technique, has been developed to precision cut nanowires into nanodots of well-defined sizes and shapes. The technique allows the determination of the growth direction, the shape of the cross section, the internal atomic structure (including twinning or other stacking faults, if any) of single nanowires. In our experiments, both the coaxial structure of vertical cross section of normal silicon nanowires (SiNWs) and horizontal cross section of necklace-like SiNWs were obtained and examined under TEM. |
doi_str_mv | 10.1021/nl034603v |
format | article |
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source | American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list) |
subjects | Applied sciences Cross-disciplinary physics: materials science rheology Electronics Exact sciences and technology Materials science Molecular electronics, nanoelectronics Nanoscale materials and structures: fabrication and characterization Physics Quantum wires Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Precision-Cut Crystalline Silicon Nanodots and Nanorods from Nanowires and Direct Visualization of Cross Sections and Growth Orientations of Silicon Nanowires |
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