Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets

A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is o...

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Bibliographic Details
Published in:Nano letters 2007-12, Vol.7 (12), p.3569-3575
Main Authors: Jung, Inhwa, Pelton, Matthew, Piner, Richard, Dikin, Dmitriy A, Stankovich, Sasha, Watcharotone, Supinda, Hausner, Martina, Ruoff, Rodney S
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Fullerenes and related materials
Fullerenes and related materials
diamonds, graphite
Materials science
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
Physics
Specific materials
Visible and ultraviolet spectra
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Summary:A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl0714177