Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy

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Bibliographic Details
Published in:Nano letters 2015-04, Vol.15 (4), p.2278-2284
Main Authors: Howell, Sarah L., Jariwala, Deep, Wu, Chung-Chiang, Chen, Kan-Sheng, Sangwan, Vinod K., Kang, Junmo, Marks, Tobin J., Hersam, Mark C., Lauhon, Lincoln J.
Format: Article
Language:English
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ISSN:1530-6984
1530-6992
DOI:10.1021/nl504311p