Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy

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Published in:Nano letters 2015-04, Vol.15 (4), p.2278-2284
Main Authors: Howell, Sarah L., Jariwala, Deep, Wu, Chung-Chiang, Chen, Kan-Sheng, Sangwan, Vinod K., Kang, Junmo, Marks, Tobin J., Hersam, Mark C., Lauhon, Lincoln J.
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cited_by cdi_FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3
cites cdi_FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3
container_end_page 2284
container_issue 4
container_start_page 2278
container_title Nano letters
container_volume 15
creator Howell, Sarah L.
Jariwala, Deep
Wu, Chung-Chiang
Chen, Kan-Sheng
Sangwan, Vinod K.
Kang, Junmo
Marks, Tobin J.
Hersam, Mark C.
Lauhon, Lincoln J.
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doi_str_mv 10.1021/nl504311p
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1021_nl504311p</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1021_nl504311p</sourcerecordid><originalsourceid>FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3</originalsourceid><addsrcrecordid>eNo9kE1OwzAQhS0EEqWw4Abesgj4J3GSJVRQiloVqd1Hjj0ugWBHtouUHXfghpyEBFBXb96TvpnRQ-iSkmtKGL2xbUZSTml3hCY04yQRZcmOD3ORnqKzEF4JISXPyAS9LewHhNjsZGycxc7gO2l1sjYmQAxYRrxy1rWyB__9-bXat7H5NUO8wQw_7a0awYDrHm-UtLaxO_z84qJTe-_BDnyjvAvKdf05OjGyDXDxr1O0fbjfzh6T5Xq-mN0uE5WnXVIXslaSyAKUSEvFzfCq0nnOQAil0zzLSwJZLZkAXlKRa8WIMNoURtegAfgUXf2tHe8GD6bqfPMufV9RUo0lVYeS-A8W2l5S</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy</title><source>American Chemical Society:Jisc Collections:American Chemical Society Read &amp; Publish Agreement 2022-2024 (Reading list)</source><creator>Howell, Sarah L. ; Jariwala, Deep ; Wu, Chung-Chiang ; Chen, Kan-Sheng ; Sangwan, Vinod K. ; Kang, Junmo ; Marks, Tobin J. ; Hersam, Mark C. ; Lauhon, Lincoln J.</creator><creatorcontrib>Howell, Sarah L. ; Jariwala, Deep ; Wu, Chung-Chiang ; Chen, Kan-Sheng ; Sangwan, Vinod K. ; Kang, Junmo ; Marks, Tobin J. ; Hersam, Mark C. ; Lauhon, Lincoln J.</creatorcontrib><identifier>ISSN: 1530-6984</identifier><identifier>EISSN: 1530-6992</identifier><identifier>DOI: 10.1021/nl504311p</identifier><language>eng</language><ispartof>Nano letters, 2015-04, Vol.15 (4), p.2278-2284</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3</citedby><cites>FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Howell, Sarah L.</creatorcontrib><creatorcontrib>Jariwala, Deep</creatorcontrib><creatorcontrib>Wu, Chung-Chiang</creatorcontrib><creatorcontrib>Chen, Kan-Sheng</creatorcontrib><creatorcontrib>Sangwan, Vinod K.</creatorcontrib><creatorcontrib>Kang, Junmo</creatorcontrib><creatorcontrib>Marks, Tobin J.</creatorcontrib><creatorcontrib>Hersam, Mark C.</creatorcontrib><creatorcontrib>Lauhon, Lincoln J.</creatorcontrib><title>Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy</title><title>Nano letters</title><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNo9kE1OwzAQhS0EEqWw4Abesgj4J3GSJVRQiloVqd1Hjj0ugWBHtouUHXfghpyEBFBXb96TvpnRQ-iSkmtKGL2xbUZSTml3hCY04yQRZcmOD3ORnqKzEF4JISXPyAS9LewHhNjsZGycxc7gO2l1sjYmQAxYRrxy1rWyB__9-bXat7H5NUO8wQw_7a0awYDrHm-UtLaxO_z84qJTe-_BDnyjvAvKdf05OjGyDXDxr1O0fbjfzh6T5Xq-mN0uE5WnXVIXslaSyAKUSEvFzfCq0nnOQAil0zzLSwJZLZkAXlKRa8WIMNoURtegAfgUXf2tHe8GD6bqfPMufV9RUo0lVYeS-A8W2l5S</recordid><startdate>20150408</startdate><enddate>20150408</enddate><creator>Howell, Sarah L.</creator><creator>Jariwala, Deep</creator><creator>Wu, Chung-Chiang</creator><creator>Chen, Kan-Sheng</creator><creator>Sangwan, Vinod K.</creator><creator>Kang, Junmo</creator><creator>Marks, Tobin J.</creator><creator>Hersam, Mark C.</creator><creator>Lauhon, Lincoln J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150408</creationdate><title>Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy</title><author>Howell, Sarah L. ; Jariwala, Deep ; Wu, Chung-Chiang ; Chen, Kan-Sheng ; Sangwan, Vinod K. ; Kang, Junmo ; Marks, Tobin J. ; Hersam, Mark C. ; Lauhon, Lincoln J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Howell, Sarah L.</creatorcontrib><creatorcontrib>Jariwala, Deep</creatorcontrib><creatorcontrib>Wu, Chung-Chiang</creatorcontrib><creatorcontrib>Chen, Kan-Sheng</creatorcontrib><creatorcontrib>Sangwan, Vinod K.</creatorcontrib><creatorcontrib>Kang, Junmo</creatorcontrib><creatorcontrib>Marks, Tobin J.</creatorcontrib><creatorcontrib>Hersam, Mark C.</creatorcontrib><creatorcontrib>Lauhon, Lincoln J.</creatorcontrib><collection>CrossRef</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Howell, Sarah L.</au><au>Jariwala, Deep</au><au>Wu, Chung-Chiang</au><au>Chen, Kan-Sheng</au><au>Sangwan, Vinod K.</au><au>Kang, Junmo</au><au>Marks, Tobin J.</au><au>Hersam, Mark C.</au><au>Lauhon, Lincoln J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy</atitle><jtitle>Nano letters</jtitle><date>2015-04-08</date><risdate>2015</risdate><volume>15</volume><issue>4</issue><spage>2278</spage><epage>2284</epage><pages>2278-2284</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><doi>10.1021/nl504311p</doi><tpages>7</tpages></addata></record>
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source American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list)
title Investigation of Band-Offsets at Monolayer–Multilayer MoS 2 Junctions by Scanning Photocurrent Microscopy
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A56%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20Band-Offsets%20at%20Monolayer%E2%80%93Multilayer%20MoS%202%20Junctions%20by%20Scanning%20Photocurrent%20Microscopy&rft.jtitle=Nano%20letters&rft.au=Howell,%20Sarah%20L.&rft.date=2015-04-08&rft.volume=15&rft.issue=4&rft.spage=2278&rft.epage=2284&rft.pages=2278-2284&rft.issn=1530-6984&rft.eissn=1530-6992&rft_id=info:doi/10.1021/nl504311p&rft_dat=%3Ccrossref%3E10_1021_nl504311p%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c74p-b8abca0a8ec649c3f009cd772e66cd475790e5ba26e39167dc206fdf8fdbedee3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true