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X-ray spectral microinvestigation of the chemical states of atoms in Cd x Hg 1–x Te—GaAs thin films
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Published in: | Analyst (London) 1992, Vol.117 (4), p.803-805 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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ISSN: | 0003-2654 1364-5528 |
DOI: | 10.1039/AN9921700803 |