Probing the PEDOT:PSS/cell interface with conductive colloidal probe AFM-SECM

Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive col...

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Bibliographic Details
Published in:Nanoscale 2016-02, Vol.8 (8), p.4475-4481
Main Authors: Knittel, P, Zhang, H, Kranz, C, Wallace, G. G, Higgins, M. J
Format: Article
Language:English
Subjects:
Animals
Cell Adhesion - physiology
Cell Line
Electrochemical Techniques
Electrodes
Mice
Microscopy, Atomic Force
Microscopy, Electron, Scanning
Molecular Probes - chemistry
Polystyrenes - chemistry
Thiophenes - chemistry
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Summary:Conductive colloidal probe Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) is a new approach, which employs electrically insulated AFM probes except for a gold-coated colloid located at the end of the cantilever. Hence, force measurements can be performed while biasing the conductive colloid under physiological conditions. Moreover, such colloids can be modified by electrochemical polymerization resulting, e.g. in conductive polymer-coated spheres, which in addition may be loaded with specific dopants. In contrast to other AFM-based single cell force spectroscopy measurements, these probes allow adhesion measurements at the cell-biomaterial interface on multiple cells in a rapid manner while the properties of the polymer can be changed by applying a bias. In addition, spatially resolved electrochemical information e.g. , oxygen reduction can be obtained simultaneously. Conductive colloid AFM-SECM probes modified with poly(3,4-ethylenedioxythiophene) doped with polystyrene sulfonate (PEDOT:PSS) are used for single cell force measurements in mouse fibroblasts and single cell interactions are investigated as a function of the applied potential. We introduce a novel conductive colloidal Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) probe for single cell force spectroscopy that enables detection of single cell and molecular-level force interactions at electromaterial interfaces whilst applying electrical stimulation.
ISSN:2040-3364
2040-3372
DOI:10.1039/c5nr07155k