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Dielectric dispersion and superior thermal characteristics in isotope-enriched hexagonal boron nitride thin films: evaluation as thermally self-dissipating dielectrics for GaN transistors
High performance tuneable dielectrics at millimetre-wave frequencies are crucial constituents for emerging adaptive and reconfigurable electronic applications in the automotive, artificial intelligence, and telecommunication industries. Hexagonal boron nitride (h-BN), an ideal candidate for gate-ins...
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Published in: | Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2020-07, Vol.8 (28), p.9558-9568 |
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creator | Chng, Soon Siang Zhu, Minmin Du, Zehui Wang, Xizu Whiteside, Matthew Ng, Zhi Kai Shakerzadeh, Maziar Tsang, Siu Hon Teo, Edwin Hang Tong |
description | High performance tuneable dielectrics at millimetre-wave frequencies are crucial constituents for emerging adaptive and reconfigurable electronic applications in the automotive, artificial intelligence, and telecommunication industries. Hexagonal boron nitride (h-BN), an ideal candidate for gate-insulating dielectrics, is attractive for integrated circuits and photonic devices. However, advanced application to electronic and optoelectronic devices has often been limited by synthesis techniques and flake size, as well as dielectric reliability. Herein, we have studied the isotope engineering of h-BN thin films directly grown on wafer-scale Si and GaN substrates with pure boron isotopes (B
10
and B
11
) in comparison with controlled isotopic compositions. The dielectric characteristics of isotope-enriched h-BN films at frequencies ranging up to 10
7
Hz were investigated, exhibiting a broad dielectric dispersion with a low dielectric loss, below 1.3%. Furthermore, their optical band gap energies indicate a strong dependence on isotopic composition, ranging from 5.54 to 5.79 eV. Thermal conductivity of pure B
10
N and B
11
N over a broad temperature range is superior to those of other compositions, with an enhancement of around 231%. Therefore, the great thermal response combined with excellent dielectric properties and a wide band gap make h-BN a promising dielectric material for heat self-dissipating GaN and AlGaN /GaN transistors. Hall mobility, sheet resistivity and sheet concentration of GaN with B
10
N films were analyzed, ascertaining that h-BN does function well as both a dielectric layer and a passivating layer on electronic devices. Our findings could lead to microelectronics thermal management and integrated optoelectronic applications at these frequencies.
The isotope-enriched h-BN films exhibited a dielectrics dispersion with low dielectric loss, below 1.3%. Their optical band gaps depend on isotopic composition (5.54 to 5.79 eV). Thermal conductivity of pure B
10/11
N are enhanced by around 231%. |
doi_str_mv | 10.1039/d0tc02253e |
format | article |
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10
and B
11
) in comparison with controlled isotopic compositions. The dielectric characteristics of isotope-enriched h-BN films at frequencies ranging up to 10
7
Hz were investigated, exhibiting a broad dielectric dispersion with a low dielectric loss, below 1.3%. Furthermore, their optical band gap energies indicate a strong dependence on isotopic composition, ranging from 5.54 to 5.79 eV. Thermal conductivity of pure B
10
N and B
11
N over a broad temperature range is superior to those of other compositions, with an enhancement of around 231%. Therefore, the great thermal response combined with excellent dielectric properties and a wide band gap make h-BN a promising dielectric material for heat self-dissipating GaN and AlGaN /GaN transistors. Hall mobility, sheet resistivity and sheet concentration of GaN with B
10
N films were analyzed, ascertaining that h-BN does function well as both a dielectric layer and a passivating layer on electronic devices. Our findings could lead to microelectronics thermal management and integrated optoelectronic applications at these frequencies.
The isotope-enriched h-BN films exhibited a dielectrics dispersion with low dielectric loss, below 1.3%. Their optical band gaps depend on isotopic composition (5.54 to 5.79 eV). Thermal conductivity of pure B
10/11
N are enhanced by around 231%.</description><identifier>ISSN: 2050-7526</identifier><identifier>EISSN: 2050-7534</identifier><identifier>DOI: 10.1039/d0tc02253e</identifier><language>eng</language><publisher>Cambridge: Royal Society of Chemistry</publisher><subject>Aluminum gallium nitrides ; Artificial intelligence ; Boron ; Boron isotopes ; Boron nitride ; Composition ; Dielectric loss ; Dielectric properties ; Electron mobility ; Electronic devices ; Electronic properties ; Energy gap ; Gallium nitrides ; Hall effect ; Integrated circuits ; Millimeter waves ; Optoelectronic devices ; Raman spectra ; Reliability engineering ; Semiconductor devices ; Silicon ; Silicon substrates ; Thermal conductivity ; Thermal management ; Thin films ; Transistors</subject><ispartof>Journal of materials chemistry. C, Materials for optical and electronic devices, 2020-07, Vol.8 (28), p.9558-9568</ispartof><rights>Copyright Royal Society of Chemistry 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-6729ff4ec1c57d668cac9d2c3168ccf44f1630b5e1845ed90f552622d00ead73</citedby><cites>FETCH-LOGICAL-c380t-6729ff4ec1c57d668cac9d2c3168ccf44f1630b5e1845ed90f552622d00ead73</cites><orcidid>0000-0001-8701-3477 ; 0000-0001-5565-216X ; 0000-0002-5511-7455 ; 0000-0002-8957-2261 ; 0000-0003-0528-1764 ; 0000-0003-3945-5443</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Chng, Soon Siang</creatorcontrib><creatorcontrib>Zhu, Minmin</creatorcontrib><creatorcontrib>Du, Zehui</creatorcontrib><creatorcontrib>Wang, Xizu</creatorcontrib><creatorcontrib>Whiteside, Matthew</creatorcontrib><creatorcontrib>Ng, Zhi Kai</creatorcontrib><creatorcontrib>Shakerzadeh, Maziar</creatorcontrib><creatorcontrib>Tsang, Siu Hon</creatorcontrib><creatorcontrib>Teo, Edwin Hang Tong</creatorcontrib><title>Dielectric dispersion and superior thermal characteristics in isotope-enriched hexagonal boron nitride thin films: evaluation as thermally self-dissipating dielectrics for GaN transistors</title><title>Journal of materials chemistry. C, Materials for optical and electronic devices</title><description>High performance tuneable dielectrics at millimetre-wave frequencies are crucial constituents for emerging adaptive and reconfigurable electronic applications in the automotive, artificial intelligence, and telecommunication industries. Hexagonal boron nitride (h-BN), an ideal candidate for gate-insulating dielectrics, is attractive for integrated circuits and photonic devices. However, advanced application to electronic and optoelectronic devices has often been limited by synthesis techniques and flake size, as well as dielectric reliability. Herein, we have studied the isotope engineering of h-BN thin films directly grown on wafer-scale Si and GaN substrates with pure boron isotopes (B
10
and B
11
) in comparison with controlled isotopic compositions. The dielectric characteristics of isotope-enriched h-BN films at frequencies ranging up to 10
7
Hz were investigated, exhibiting a broad dielectric dispersion with a low dielectric loss, below 1.3%. Furthermore, their optical band gap energies indicate a strong dependence on isotopic composition, ranging from 5.54 to 5.79 eV. Thermal conductivity of pure B
10
N and B
11
N over a broad temperature range is superior to those of other compositions, with an enhancement of around 231%. Therefore, the great thermal response combined with excellent dielectric properties and a wide band gap make h-BN a promising dielectric material for heat self-dissipating GaN and AlGaN /GaN transistors. Hall mobility, sheet resistivity and sheet concentration of GaN with B
10
N films were analyzed, ascertaining that h-BN does function well as both a dielectric layer and a passivating layer on electronic devices. Our findings could lead to microelectronics thermal management and integrated optoelectronic applications at these frequencies.
The isotope-enriched h-BN films exhibited a dielectrics dispersion with low dielectric loss, below 1.3%. Their optical band gaps depend on isotopic composition (5.54 to 5.79 eV). Thermal conductivity of pure B
10/11
N are enhanced by around 231%.</description><subject>Aluminum gallium nitrides</subject><subject>Artificial intelligence</subject><subject>Boron</subject><subject>Boron isotopes</subject><subject>Boron nitride</subject><subject>Composition</subject><subject>Dielectric loss</subject><subject>Dielectric properties</subject><subject>Electron mobility</subject><subject>Electronic devices</subject><subject>Electronic properties</subject><subject>Energy gap</subject><subject>Gallium nitrides</subject><subject>Hall effect</subject><subject>Integrated circuits</subject><subject>Millimeter waves</subject><subject>Optoelectronic devices</subject><subject>Raman spectra</subject><subject>Reliability engineering</subject><subject>Semiconductor devices</subject><subject>Silicon</subject><subject>Silicon substrates</subject><subject>Thermal conductivity</subject><subject>Thermal management</subject><subject>Thin films</subject><subject>Transistors</subject><issn>2050-7526</issn><issn>2050-7534</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp9kUtLAzEUhQdRUKob90LEnTCaSebpTmp9QNFN90Oa3NjIdDLmpqK_zT_n1dq6M5s8zse5J_cmyXHGLzIum0vDo-ZCFBJ2kgPBC55Whcx3t2dR7idHiC-cVp2VddkcJJ83DjrQMTjNjMMBAjrfM9Ubhiu6OR9YXEBYqo7phQpKR3rE6DQy1zOHPvoBUujJYAGGLeBdPfue6LkPZNQ7sjZAHkRb1y3xisGb6lYq_tTBjXv3wRA6m1IIdAOp_TMF2mRDZinInXpkMageKYAPeJjsWdUhHP3uo2R2O5mN79Pp093D-HqaalnzmJaVaKzNQWe6qExZ1lrpxggtqQVa2zy3WSn5vICszgswDbcFtUoIwzkoU8lRcra2HYJ_XQHG9sWvAn0RW5GLSma8KjhR52tKB48YwLZDcEsVPtqMt9_jaW_4bPwzngnBJ2s4oN5yf-Mj_fQ_vR2MlV88lp2A</recordid><startdate>20200728</startdate><enddate>20200728</enddate><creator>Chng, Soon Siang</creator><creator>Zhu, Minmin</creator><creator>Du, Zehui</creator><creator>Wang, Xizu</creator><creator>Whiteside, Matthew</creator><creator>Ng, Zhi Kai</creator><creator>Shakerzadeh, Maziar</creator><creator>Tsang, Siu Hon</creator><creator>Teo, Edwin Hang Tong</creator><general>Royal Society of Chemistry</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-8701-3477</orcidid><orcidid>https://orcid.org/0000-0001-5565-216X</orcidid><orcidid>https://orcid.org/0000-0002-5511-7455</orcidid><orcidid>https://orcid.org/0000-0002-8957-2261</orcidid><orcidid>https://orcid.org/0000-0003-0528-1764</orcidid><orcidid>https://orcid.org/0000-0003-3945-5443</orcidid></search><sort><creationdate>20200728</creationdate><title>Dielectric dispersion and superior thermal characteristics in isotope-enriched hexagonal boron nitride thin films: evaluation as thermally self-dissipating dielectrics for GaN transistors</title><author>Chng, Soon Siang ; Zhu, Minmin ; Du, Zehui ; Wang, Xizu ; Whiteside, Matthew ; Ng, Zhi Kai ; Shakerzadeh, Maziar ; Tsang, Siu Hon ; Teo, Edwin Hang Tong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-6729ff4ec1c57d668cac9d2c3168ccf44f1630b5e1845ed90f552622d00ead73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Aluminum gallium nitrides</topic><topic>Artificial intelligence</topic><topic>Boron</topic><topic>Boron isotopes</topic><topic>Boron nitride</topic><topic>Composition</topic><topic>Dielectric loss</topic><topic>Dielectric properties</topic><topic>Electron mobility</topic><topic>Electronic devices</topic><topic>Electronic properties</topic><topic>Energy gap</topic><topic>Gallium nitrides</topic><topic>Hall effect</topic><topic>Integrated circuits</topic><topic>Millimeter waves</topic><topic>Optoelectronic devices</topic><topic>Raman spectra</topic><topic>Reliability engineering</topic><topic>Semiconductor devices</topic><topic>Silicon</topic><topic>Silicon substrates</topic><topic>Thermal conductivity</topic><topic>Thermal management</topic><topic>Thin films</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chng, Soon Siang</creatorcontrib><creatorcontrib>Zhu, Minmin</creatorcontrib><creatorcontrib>Du, Zehui</creatorcontrib><creatorcontrib>Wang, Xizu</creatorcontrib><creatorcontrib>Whiteside, Matthew</creatorcontrib><creatorcontrib>Ng, Zhi Kai</creatorcontrib><creatorcontrib>Shakerzadeh, Maziar</creatorcontrib><creatorcontrib>Tsang, Siu Hon</creatorcontrib><creatorcontrib>Teo, Edwin Hang Tong</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials chemistry. C, Materials for optical and electronic devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chng, Soon Siang</au><au>Zhu, Minmin</au><au>Du, Zehui</au><au>Wang, Xizu</au><au>Whiteside, Matthew</au><au>Ng, Zhi Kai</au><au>Shakerzadeh, Maziar</au><au>Tsang, Siu Hon</au><au>Teo, Edwin Hang Tong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric dispersion and superior thermal characteristics in isotope-enriched hexagonal boron nitride thin films: evaluation as thermally self-dissipating dielectrics for GaN transistors</atitle><jtitle>Journal of materials chemistry. C, Materials for optical and electronic devices</jtitle><date>2020-07-28</date><risdate>2020</risdate><volume>8</volume><issue>28</issue><spage>9558</spage><epage>9568</epage><pages>9558-9568</pages><issn>2050-7526</issn><eissn>2050-7534</eissn><abstract>High performance tuneable dielectrics at millimetre-wave frequencies are crucial constituents for emerging adaptive and reconfigurable electronic applications in the automotive, artificial intelligence, and telecommunication industries. Hexagonal boron nitride (h-BN), an ideal candidate for gate-insulating dielectrics, is attractive for integrated circuits and photonic devices. However, advanced application to electronic and optoelectronic devices has often been limited by synthesis techniques and flake size, as well as dielectric reliability. Herein, we have studied the isotope engineering of h-BN thin films directly grown on wafer-scale Si and GaN substrates with pure boron isotopes (B
10
and B
11
) in comparison with controlled isotopic compositions. The dielectric characteristics of isotope-enriched h-BN films at frequencies ranging up to 10
7
Hz were investigated, exhibiting a broad dielectric dispersion with a low dielectric loss, below 1.3%. Furthermore, their optical band gap energies indicate a strong dependence on isotopic composition, ranging from 5.54 to 5.79 eV. Thermal conductivity of pure B
10
N and B
11
N over a broad temperature range is superior to those of other compositions, with an enhancement of around 231%. Therefore, the great thermal response combined with excellent dielectric properties and a wide band gap make h-BN a promising dielectric material for heat self-dissipating GaN and AlGaN /GaN transistors. Hall mobility, sheet resistivity and sheet concentration of GaN with B
10
N films were analyzed, ascertaining that h-BN does function well as both a dielectric layer and a passivating layer on electronic devices. Our findings could lead to microelectronics thermal management and integrated optoelectronic applications at these frequencies.
The isotope-enriched h-BN films exhibited a dielectrics dispersion with low dielectric loss, below 1.3%. Their optical band gaps depend on isotopic composition (5.54 to 5.79 eV). Thermal conductivity of pure B
10/11
N are enhanced by around 231%.</abstract><cop>Cambridge</cop><pub>Royal Society of Chemistry</pub><doi>10.1039/d0tc02253e</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0001-8701-3477</orcidid><orcidid>https://orcid.org/0000-0001-5565-216X</orcidid><orcidid>https://orcid.org/0000-0002-5511-7455</orcidid><orcidid>https://orcid.org/0000-0002-8957-2261</orcidid><orcidid>https://orcid.org/0000-0003-0528-1764</orcidid><orcidid>https://orcid.org/0000-0003-3945-5443</orcidid><oa>free_for_read</oa></addata></record> |
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source | Royal Society of Chemistry |
subjects | Aluminum gallium nitrides Artificial intelligence Boron Boron isotopes Boron nitride Composition Dielectric loss Dielectric properties Electron mobility Electronic devices Electronic properties Energy gap Gallium nitrides Hall effect Integrated circuits Millimeter waves Optoelectronic devices Raman spectra Reliability engineering Semiconductor devices Silicon Silicon substrates Thermal conductivity Thermal management Thin films Transistors |
title | Dielectric dispersion and superior thermal characteristics in isotope-enriched hexagonal boron nitride thin films: evaluation as thermally self-dissipating dielectrics for GaN transistors |
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