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Epitaxial growth of β-Ga 2 O 3 (−201) thin film on four-fold symmetry CeO 2 (001) substrate for heterogeneous integrations
β-Ga 2 O 3 is a wide bandgap semiconductor material that is promising for many fields such as gas sensors, UV detectors, and high-power electronics. Until now, most epitaxial β-Ga 2 O 3 thin films could only be realized on six-fold symmetric single crystal substrates including sapphire (0001), 3C-Si...
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Published in: | Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2021-11, Vol.9 (44), p.15868-15876 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | β-Ga
2
O
3
is a wide bandgap semiconductor material that is promising for many fields such as gas sensors, UV detectors, and high-power electronics. Until now, most epitaxial β-Ga
2
O
3
thin films could only be realized on six-fold symmetric single crystal substrates including sapphire (0001), 3C-SiC (001), and native β-Ga
2
O
3
. In this report, we demonstrate the epitaxial growth of β-Ga
2
O
3
(−201) thin films on non-six-fold symmetric substrates,
i.e.
, the CeO
2
(001) substrate. Different from the conventional six-fold symmetric sapphire substrates, the four-fold symmetric cubic phase CeO
2
(001) induces the formation of two sets of hexagonal-like atom frameworks with a mutual rotation angle of 90° in the β-Ga
2
O
3
(−201) plane. This is due to the small lattice mismatch between the β-Ga
2
O
3
(−201) plane and the CeO
2
(001) plane in two directions: CeO
2
[100]//β-Ga
2
O
3
[010] and CeO
2
[010]//β-Ga
2
O
3
[010]. Besides, the valence band offset (VBO) and the conduction band offset (CBO) at the β-Ga
2
O
3
/CeO
2
heterojunction are examined using high-resolution X-ray photoelectron spectroscopy (HR-XPS) and are estimated to be 1.63 eV and 0.18 eV, respectively, suggesting a type-II heterostructure. The obtained epitaxial β-Ga
2
O
3
thin films are fabricated into photodetectors (PDs), which show key photoelectrical characteristics that are similar to those of PDs using the conventional sapphire substrate. The results indicate the epitaxial β-Ga
2
O
3
thin films on CeO
2
have a high crystallization quality, and thus are capable of producing various essential devices. Moreover, the epitaxy between β-Ga
2
O
3
(−201) and CeO
2
(001) demonstrated in this work can pave the way for constructing heterostructures between β-Ga
2
O
3
and other cubic-phase functional materials, such as p-type semiconductors, piezoelectric semiconductors, and superconductors. |
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ISSN: | 2050-7526 2050-7534 |
DOI: | 10.1039/D1TC02852A |