Atmospheric Pressure Spatial Atomic Layer Deposition of p-type CuO thin films from copper (II) acetylacetonate and ozone for UV detection

• Published in: Dalton transactions : an international journal of inorganic chemistry 2025
• Main Authors: Tran Vu, Hung-Anh, Pham Duc, Trung, Tran Thi My, Hang, Duong Duc, Anh, Alshehri, Abdullah H., Tran, Van Tan, Nguyen, Thi Minh Hien, Pham, Cong De, Nguyen, Viet Huong
• Format: Article
• Language: English
• ISSN: 1477-9226; 1477-9234
• DOI: 10.1039/D4DT02689F

Cupric oxide (CuO) is a promising p-type semiconducting oxide for many critical fields such as energy conversion and storage, and gas sensors, attributed to their unique optoelectrical properties and cost-effectiveness. This work successfully deposited amorphous, pinhole-free, ultrathin CuO films using atmospheric pressure spatial atomic layer deposition (SALD) with copper (II) acetylacetonate and ozone as precursors. The growth rate increased from 0.05 Å/cycle at 175 °C to 0.35 Å/cycle at 275 °C. XPS and XRD confirmed the formation of a pure CuO phase, with typical strong satellite shakeup peaks, and tenorite crystalline phase. The films exhibited semiconducting behavior, with temperature-dependent electrical measurements revealing the Fermi level positioned 0.2–0.24 eV above the valence band. Furthermore, p-type CuO was combined with n-type ZnO, both deposited by SALD, to form a high-performance photodiode. This CuO/ZnO heterojunction demonstrated excellent rectifying behavior, with an ION /IOFF ratio of 2.04×10 3 , and functioned as an efficient UV detector, showing fast response and good repeatability. These results highlight the potential of SALD-deposited CuO thin films for optoelectronic applications